9030 82 00 För mätning och kontroll av halvledarplattor (wafers) eller halvledarkomponenter (även integrerade kretsar)

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Källor: Tullverket (Tulltaxan), EUR-Lex · cn2026. Ursprungsland, förmånstull och nästa steg ›

Varor som har klassificerats här

Exempel ur EU:s databas över bindande klassificeringsbesked (BKB/BTI). Beskeden gäller bara för sin innehavare och många har löpt ut — se dem som vägledning, inte som beslut för din vara.

• HIGH PERFORMANCE FIELD PROGRAMMABLE GATE ARRAY (FPGA) BOARD USED IN THE ELECTRICAL TESTING OF SEMICONDUCTOR DEVICES. THE FPGA BOARD CAN ACCOMMODATE UP TO 18 MILLION APPLICATION SPECIFIC INTEGRATED CIRCUIT GATES, CUSTOMISED FOR THE SPECIFIC USE OF ELECTRICAL MEASURING AND CHECKING OF SEMICONDUCTOR DEVICES PRIOR TO MANUFACTURING. THE PRODUCT INCORPORATES FULL SYSTEM INTEGRATION AND TESTING OF ALL…

  9030 82 00 · GB 2013 · GB123151225

• THIS IS A PORTABLE METER USED IN RESEARCHING SEMICONDUCTOR MATERIALS. THE UNIT CAN BE BATTERY OPERATED OR OPERATED FROM THE MAINS ELECTRICITY SUPPLY USING THE SUPPLIED 9 VOLT ADAPTER. IT SUPPLIES ONE OF THE 6 FIXED CONSTANT CURRENTS AND HAS A DIGITAL VOLTAGE DISPLAY. USED IN CONJUNCTION WITH A FOUR POINT PROBE THE READINGS CAN BE USED TO DETERMINE THE RESISTIVITY OF THE TEST SAMPLE. THE UBIT CAN…

  9030 82 00 · GB 2008 · GB117783257

• THIS IS AN ELECTRONIC UNIT THAT USES A FOUR POINT PROBE TO DETERMINE A SEMICONDUCTOR'S CONDUCTIVITY TYPE VIA THE RECTIFICATION METHOD. AN AC VOLTAGE IS APPLIED BETWEEN PROBES 1 AND 3 AND THE RESULTING POTEBTIAL BETWEEN NEEDLES 2 AND 4. THE VOLTAGE DROP V42 IS SMALL WHEN THE AC VOLTAGE AT PROBE 2 IS POSITIVE BECAUSE THE METAL SEMICONDUCTOR JUNCTION IS FORWARD BIASED. BUT FOR NEGATIVE VOLTAGE AT…

  9030 82 00 · GB 2008 · GB117782456

• THIS UNIT IS A COMBINED CONSTANT CURRENT SOURCE AND DIGITAL VOLTMETER. THE USER CAN INPUT THE DESIRED LEVEL OF CONSTANT CURRENT OR CHOOSE A SIMPLE AUTO RANGING FUNCTION. USED IN CONJUNCTION WITH A FOUR POINT PROBE THE READINGS CAN BE USED TO DETERMINE THE RESISTIVITY OF SEMICONDUCTOR SAMPLES. TYPICALLY USED IN RESEARCH APPLICATIONS, THE UNIT CAN BE OPERATED AS A STAND ALONE UNIT, OR BY USING THE…

  9030 82 00 · GB 2008 · GB117783845

• APPARATUS FOR MEASURING OR CHECKING THE ELECTRICAL QUANTITIES OF SEMICONDUCTOR DEVICES (SOLAR MODULES OF 85414090). THIS MACHINE INSPECTS THE FINISHED SOLAR MODULE TO CONFIRM ITS OUTPUT POWER BY MEANS OF STROBE LIGHTING WHICH REPLACES SUNLIGHT.

  9030 82 00 · GB 2007 · GB500331419

• AN ANOLOGUE MEASUREMENT UNIT, WHICH MEASURE AMPLITUDE, FREQUENCY ETC. THIS IS THE PRINCIPAL MODULE, WHICH, IS USED FOR TESTING THE FUNCTIONALITY OF INTERGRATED CIRCUITS DURING THE MANUFACTURING PROCESS.

  9030 82 00 · GB 2005 · GB114329987

• THIS INSTRUMENT IS USED TO TEST MICROSTRIP AND COPLANAR SUBSTRATE DEVICES. INPUT AND OUTPUT CONNECTIONS ARE MADE TO THE DEVICE BY TWO SPRING LOADED JAWS. THE JAWS ACCOMODATE SUBSTRATES FROM 0.13 TO 1.9 MM IN THICKNESS. THE APPARATUS MEASURES RETURN LOSS AND REPEATABILITY IN THE RANGE OF DC TO 60 GHz. IT ALSO HAS MICROSTRIP, COPLANAR AND SUBSTRATE MEASUREMENT CAPABILITY.

  9030 82 00 · GB 2005 · GB113677572

• SEMICONDUCTOR CHECKING EQUIPMENT CONSISTING OF A MICRO CHAMBER, GUARDED CHUCKS, COAXIAL PROBES, A MONITOR AND LCR METER.

  9030 82 00 · IE 2004 · IE04NT-14-1602