CN code 8538 90 19 Other

TARIC codes (10 digits): 1

Origin, preferential duty and next steps ›

Examples from the EU database of Binding Tariff Information (BTI). A ruling binds only its holder and many have expired — read them as guidance, not as a decision for your product.

• FOUR POINT PROBES THAT PROVIDE A POINT OF CONTACT FOR A SEMICONDUCTOR DEVICE SO THAT A CURRENT CAN BE DRIVEN THROUGH THE SAMPLE AND A RESULTANT VOLTAGE DROP MEASURED. THE PROBES HAVE TUNGSTEN CARBIDE NEEDLES FOR DURABILITY AND ELECTRICAL CONDUCTIVITY AND THE NEEDLES ARE INDIVIDUALLY SPRING LOADED. THESE ARE SPARE/CONSUMABLE PARTS FOR WAFER PROBERS.

  8538 90 19 · GB 2017 · GB503378069

• FOUR POINT RESISTIVITY PROBE HEADS THAT PROVIDE A MEANS OF MAKING ELECTRICAL CONTACT AT EACH POINT ON A CONDUCTING OR SEMICONDUCTING MATERIAL. THE NEEDLES ARE TUNGSTEN CARBIDE RODS WHOSE TIPS ARE GROUND AND POLISHED. THE NEEDLES HAVE A MEANS OF ELECTRICAL CONTACT VIA A LEAD OR PLUG TO AN ELECTRONIC MEASUREMENT APPARATUS. THE NEEDLES ARE GUIDED AND ELECTRICALLY INSULATED BY PIERCED JEWELS AND ARE…

  8538 90 19 · GB 2008 · GB117783943

• MICROPOSITION PROBE STAND UNIT IS USED TO FACILITATE CONTACT OF A FOUR POINT PROBE WITH SMALL SEMICONDUCTOR TEST SAMPLES. THE TEST MATERIAL IS PLACED ON A HARD ANODISED ALUMINIUM RITARY STAGE, WHICH CAM BE MOVED IN X-Y MOTION BY USE OF MICROMETER SCREW GAUGES WITH OPTICAL VACUUM RETENTION. THE USER BRINGS THE FOUR POINT PROBE INTO CONTACT WITH THE TEST MATERIAL VIA USE OF A LEVER AND FACILITATES…

  8538 90 19 · GB 2008 · GB117782652

• MULTIHEIGHT MICROPOSITION PROBE STAND. THIS PROBE STAND HOLDS A FOUR POINT PROBE FOR MEASUREMENT OF SEMICONDUCTOR MATERIALS. THE UNIT COMPRISES A LARGE HARD ANODISED ALUMINIUM BASE, A STAINLESS STEEL UPRIGHT POLE, AND A DELRIN RAISING AND LOWERING MECHANISM WHICH ATTACHES TO THE POLE AT USER DEFINED HEIGHTS. THE UNIT HAS A REMOVABLE X-Y STAGE WHICH CAN MANIPULATE SMALL SAMPLES IN X-Y-THETA…

  8538 90 19 · GB 2008 · GB117782554

• MULTIHEIGHT PROBE. THIS PROBE STAND HOLDS A FOUR POINT PROBE FOR MEASUREMENT OF SEMICONDUCTOR MATERIALS. THE UNIT COMPRISES A LARGE HARD ANODISED ALUMINIUM BASE, A STAINLESS STEEL UPRIGHT POLE, AND A DELRIN RAISING AND LOWERING MECHANISM WHICH ATTACHES THE POLE AT USER DEFINED HEIGHTS, SAMPLES OF VARYING THICKNESS CAN THEREFORE BE MEASURED. THE FOUR POINT PROBE IS LOWERED ONTO THE TEST SAMPLE…

  8538 90 19 · GB 2008 · GB117782848